Latest Whitepapers

Maximizing monitoring: Three key ways to improve profitability
The goals of this technical brief are to introduce the three basic ways monitoring can help achieve savings....

Accurate Test Fixture Characterization and Deembedding
For measurements of non-connectorized devices, test fixtures, probes or other structures are used to...

SubLVDS to MIPI CSI-2 Image Sensor Interface Bridge Soft IP
Many Image Signal Processor (ISP) or Application Processors (AP) use the Mobile Industry Processor Interface...

Pocket-Size Signal Source
In the not too distance past, procuring a low phase noise 1 GHz source was very expensive, limiting it...

From Prototype to Post Deployment: Linux Decision Points
Developing embedded solutions can be a journey. Not all applications start at the same place in the journey...

5 Reasons to Consider an Alternative to Linux for Your Medical Device
Medical device designers have become increasingly interested in the Linux® operating system (OS), largely...

Skyworks De-embedded Scattering Parameters
An integral part of modern RF/microwave circuit design is circuit simulation and evaluation in which...

Understanding forced air cooling in power supplies
All power supplies generate waste heat which has to be dissipated. The heating effect becomes greater...

DEVELOPMENT OF HIGH-PERFORMANCE, HIGH-VOLUME CONSUMER MEMS GYROSCOPES
This paper discusses the challenges and success factors for creating the world's first integrated MEMS...

F-240 Series CFast Card Power Fail Protection
In many applications, unintentional power loss is critical and can occur frequently. Thus, it is necessary...

Validation and Deployment Concerns to Maintain Acceptable Risk
In order to ensure an acceptable level of residual risk has been achieved prior to deploying equipment...
Sign up for Electronic Pro Tech Publish Hub
As a subscriber you will receive alerts and free access to our constantly updated library of white papers, analyst reports, case studies, web seminars and solution reports.